BS 2646-4-1991 实验室高压灭菌釜.第4部分:维修指南
作者:标准资料网 时间:2024-05-29 19:31:20 浏览:9428
来源:标准资料网
【英文标准名称】:Autoclavesforsterilizationinlaboratories-Guidetomaintenance
【原文标准名称】:实验室高压灭菌釜.第4部分:维修指南
【标准号】:BS2646-4-1991
【标准状态】:现行
【国别】:英国
【发布日期】:1991-03-29
【实施或试行日期】:1991-03-29
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:维修;训练;人员;安全措施;检验;实验室;手册;灭菌(卫生);高压釜;蒸汽灭菌器;使用说明;实验室设备;灭菌器
【英文主题词】:training;safetymeasures;personnel;laboratoryequipment;maintenance;steamsterilizers;handbooks;sterilization(hygiene);sterilizers;laboratories;inspection;instructionsforuse;autoclaves
【摘要】:FactorsfordevisingascheduleformaintenanceofautoclavescomplyingwithPart1ofBS2646.
【中国标准分类号】:N61
【国际标准分类号】:71_040_10;11_080_10
【页数】:12P.;A4
【正文语种】:英语
【英文标准名称】:StandardPracticeforAnalyticallyDescribingDepth-ProfileandLinescan-ProfileDatabyanExtendedLogisticFunction
【原文标准名称】:用扩展的逻辑函数描述深度剖面和行扫描剖面数据的标准实施规程
【标准号】:ASTME1636-2010
【标准状态】:现行
【国别】:美国
【发布日期】:2010
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.08
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:
【英文主题词】:depth-profileinterfacedata;linescaninterfacedata;logisticfunction;Compositionanalysis--metals/alloys;Extendedlogisticfunction;Interfaceprofileanalysis;Logisticfunction;SIMS(secondaryionmassspectrometry);Sputterdepthprofilingdata
【摘要】:Informationoninterfacecompositionisfrequentlyobtainedbymeasuringsurfacecompositionwhilethespecimenmaterialisgraduallyremovedbyionbombardment(seeGuideE1127andPracticeE1162).Inthisway,interfacesarerevealedandcharacterizedbythemeasurementofcompositionversusdepthtoobtainasputter-depthprofile.Theshapeofsuchinterfaceprofilescontainsinformationaboutthephysicalandchemicalpropertiesoftheinterfaceregion.Inordertoaccuratelyandunambiguouslydescribethisinterfaceregionandtodetermineitswidth(seeGuideE1438),itishelpfultodefinetheshapeoftheentireinterfaceprofilewithasingleanalyticfunction.Interfacesindepthprofilesfromonesemi-infinitemediumtoanothergenerallyhaveasigmoidalshapecharacteristicofthecumulativelogisticdistribution.Useofsuchalogisticfunctionisphysicallyappropriateandissuperiortootherfunctions(forexample,polynomials)thathaveheretoforebeenusedforinterface-profileanalysisinthatitcontainstheminimumnumberofparametersfordescribinginterfaceshapes.Measurementsofvariationsinsignalintensityorsurfacecompositionasafunctionofpositiononasurfacegiveinformationontheshapeofasteportopographicfeatureonasurfaceoronthesharpnessofaninterfaceataphaseboundary.Theshapesofstepsorotherfeaturesonasurfacecangiveinformationonthelateralresolutionofasurface-analysistechniqueifthesamplebeingmeasuredhassufficientlysharpedges(seeISO18516).Similarly,theshapesofcompositionalvariationsacrossasurfacecangiveinformationonthephysicalandchemicalpropertiesoftheinterfaceregion(forexample,theextentofmixingordiffusionacrosstheinterface).Itisconvenientintheseapplicationstodescribethemeasuredlinescanprofilewithanappropriateanalyticfunction.Althoughthelogisticdistributionisnottheonlyfunctionthatcouldbeusedtodescribemeasuredlinescans,itisphysicallyplausibleandithastheminimumnumberofparametersfordescribingsuchlinescans.Manyattemptshavebeenmadetocharacterizeinterfaceprofileswithgeneralfunctions(suchaspolynomialsorerrorfunctions)butthesehavesufferedfrominstabilitiesandaninabilitytohandlepoorlystructureddata.Choiceofthelogisticfunctionalongwithaspecificallywrittenleast-squaresprocedure(describedinAppendixX1)canprovidestatisticallyevaluatedparametersthatdescribethewidth,asymmetry,anddepthofinterfaceprofilesorlinescansinareproducibleandunambiguousway.1.1Thispracticedescribesasystematicmethodforanalyzingdepth-profileandlinescandataandforaccuratelycharacterizingtheshapeofaninterfaceregionortopographicfeature.Theprofiledataaredescribedwithanappropriateanalyticfunction,andtheparametersofthisfunctiondefinetheposition,width,andanyasymmetryoftheinterfaceorfeature.Theuseofthispracticeisrecommendedinorderthattheshapesofcompositionprofilesofinterfacesoroflinescansoftopographicfeaturesacquiredwithdifferentinstrumentsortechniquescanbeunambiguouslycomparedandinterpreted.1.2Thispracticeisintendedtobeusedfortwopurposes.First,itcanbeusedtodescribetheshapeofdepth-profilesobtainedataninterfacebetweentwodissimilarmaterialsthatmightbemeasuredbycommonsurface-analysistechniquessuchasAugerelectronspectroscopy,secondary-ionmassspectrometry,andX-rayphotoelectronspectroscopy.Second,itcanbeusedtodescribeth......
【中国标准分类号】:A41
【国际标准分类号】:71_040_50
【页数】:8P.;A4
【正文语种】:英语
